LaTiOxNy Thin Films, Measurement and Application to Microwave Device

Abstract : This paper reports about three issues: a non-destructive method for dielectric measurement of materials; the first microwave dielectric measurement of a new birth dielectric LaTiOxNy material, and a topology for X-band phase shifter based on tuneable ferroelectric thin films interdigital capacitors.
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Conference papers
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https://hal.archives-ouvertes.fr/hal-00864780
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Submitted on : Monday, September 23, 2013 - 11:38:23 AM
Last modification on : Friday, November 22, 2019 - 9:54:02 AM

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Hussein Kassem, Ahmed Ziani, Valérie Vigneras, Guillaume Lunet, Claire Le Paven-Thivet, et al.. LaTiOxNy Thin Films, Measurement and Application to Microwave Device. Microwave Conference, 2008. EuMC 2008. 38th European, Oct 2008, Amsterdam, Netherlands. pp.1362 - 1365, ⟨10.1109/EUMC.2008.4751717⟩. ⟨hal-00864780⟩

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