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Communication Dans Un Congrès Année : 2008

LaTiOxNy Thin Films, Measurement and Application to Microwave Device

Résumé

This paper reports about three issues: a non-destructive method for dielectric measurement of materials; the first microwave dielectric measurement of a new birth dielectric LaTiOxNy material, and a topology for X-band phase shifter based on tuneable ferroelectric thin films interdigital capacitors.

Domaines

Matériaux
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Dates et versions

hal-00864780 , version 1 (23-09-2013)

Identifiants

Citer

Hussein Kassem, Ahmed Ziani, Valérie Vigneras, Guillaume Lunet, Claire Le Paven-Thivet, et al.. LaTiOxNy Thin Films, Measurement and Application to Microwave Device. Microwave Conference, 2008. EuMC 2008. 38th European, Oct 2008, Amsterdam, Netherlands. pp.1362 - 1365, ⟨10.1109/EUMC.2008.4751717⟩. ⟨hal-00864780⟩
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