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Article Dans Une Revue IEEE Transactions on Applied Superconductivity Année : 2013

Roughness and texture of epitaxial LZO thin films grown on RABiTS Ni5W substrates

Résumé

Low cost Coated Conductors (CC) are required in order to put together competitive superconducting cables. The buffer layer architecture is one of the key aspects of CC processing. Very interresting results have been obtained with complex architectures. It may not be necessary to have high Jc for cable applications, thus simpler architectures can be considered. We suggested that only one buffer could be sufficient. Because the YBCO deposition needs a perfect surface for epitaxy, we aim to eliminate the different defects appearing on this surface. To do so we suggest to identify the defects. We show the annealing results of the NiW/LZO substrates with La2Zr2O7 (LZO) deposited by MOD at different annealing temperatures. The buffer layer microstructure is studied in detail and the texture is investigated as a function of the annealing temperature.

Domaines

Matériaux
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Dates et versions

hal-00814809 , version 1 (17-04-2013)

Identifiants

Citer

Jean-Louis Soubeyroux, Sarah Petit, Mélissa Mikolajczyk, Hervé Muguerra, Sébastien Pairis, et al.. Roughness and texture of epitaxial LZO thin films grown on RABiTS Ni5W substrates. IEEE Transactions on Applied Superconductivity, 2013, 23 (3), pp.7501004. ⟨10.1109/TASC.2013.2241811⟩. ⟨hal-00814809⟩

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