Analysis of textured films and periodic Grating Structures with Mueller Matrices: A new Challenge in Instrumentation with the generation of angle-resolved SE polarimeters - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Thin Solid Films Année : 2011

Analysis of textured films and periodic Grating Structures with Mueller Matrices: A new Challenge in Instrumentation with the generation of angle-resolved SE polarimeters

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hal-00789250 , version 1 (17-02-2013)

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  • HAL Id : hal-00789250 , version 1

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F. Ferrieu, Tatiana Novikova, Clément Fallet, Sami Ben Hatit, Cyril Vannuffel, et al.. Analysis of textured films and periodic Grating Structures with Mueller Matrices: A new Challenge in Instrumentation with the generation of angle-resolved SE polarimeters. Thin Solid Films, 2011, 519, pp.2608. ⟨hal-00789250⟩
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