Asymmetry of polarization reversal and current-voltage characteristics of Pt/PZT-Film/Pt:Ti/SiO2/Si-substrate structures

S.L. Bravina (1) , N.V. Morozovsky (1) , J. Costecalde (2) , Caroline Soyer (2) , Denis Remiens (2) , D. Deresmes (2)

1 Institute of Physics of NAS of Ukraine
2 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520

The characterization of the asymmetries of bipolar charge-voltage and current-voltage loops of polarization reversal and unipolar current-voltage curves for Pt/PZT-film/Pt:Ti/SiO2/Si-substrate systems was performed in the dynamic mode. The asymmetry of local deformation-voltage loops was observed by piezoresponse force microscopy. The comparison of the dependences of introduced asymmetry factors for the bipolar charge-voltage and current-voltage loops and unipolar current-voltage curves on drive voltage indicates the interconnection of ferroelectric and electrical space charge transfer asymmetries.

Domaines: Science des matériaux [cond-mat.mtrl-sci]

S.L. Bravina, N.V. Morozovsky, J. Costecalde, Caroline Soyer, Denis Remiens, et al.. Asymmetry of polarization reversal and current-voltage characteristics of Pt/PZT-Film/Pt:Ti/SiO2/Si-substrate structures. Smart Materials Research, 2011, 2011, pp.374915. ⟨10.1155/2011/374915⟩. ⟨hal-00783492⟩