Florence Sagnard, F. Bentabet, Christophe Vignat. In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band: experiments (Part II).
IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2005, 34 (3), pp.1274-1282.
〈10.1109/TIM.2005.847199〉.
〈hal-00772989〉 
