Effect of multiple transverse modes in self-mixing sensors based on vertical-cavity surface-emitting lasers, Applied Optics, vol.46, issue.4, p.611, 2007. ,
DOI : 10.1364/AO.46.000611
A PC-interfaced, compact laser-diode feedback interferometer for displacement measurements, IEEE Transactions on Instrumentation and Measurement, vol.45, issue.6, p.942, 1996. ,
DOI : 10.1109/19.543990
Self-mixing feedback in a laser diode for intra-arterial optical blood velocimetry, Applied Optics, vol.40, issue.25, p.4608, 2001. ,
DOI : 10.1364/AO.40.004608
Modeling thermal effects on the light vs. current characteristic of gain-guided vertical-cavity surface-emitting lasers, IEEE Photonics Technology Letters, vol.6, issue.2, p.139, 1994. ,
DOI : 10.1109/68.275409
A simple rate-equation-based thermal VCSEL model, Journal of Lightwave Technology, vol.17, issue.5, p.865, 1999. ,
DOI : 10.1109/50.762905
Temperature dependence of the properties of DBR mirrors used in surface normal optoelectronic devices, IEEE Photonics Technology Letters, vol.4, issue.4, p.311, 1992. ,
DOI : 10.1109/68.127197
Enhanced performance of offset-gain high-barrier vertical-cavity surface-emitting lasers, IEEE Journal of Quantum Electronics, vol.29, issue.6, p.2013, 1993. ,
DOI : 10.1109/3.234464
Temperature Analysis of Threshold Current in Infrared Vertical-Cavity Surface-Emitting Lasers, IEEE Journal of Quantum Electronics, vol.42, issue.10, p.1078, 2006. ,
DOI : 10.1109/JQE.2006.881828
External optical feedback phenomena in semiconductor lasers, IEEE Journal of Selected Topics in Quantum Electronics, vol.1, issue.2, p.480, 1995. ,
DOI : 10.1109/2944.401232
Voltage change across the self-coupled semiconductor laser, IEEE Journal of Quantum Electronics, vol.17, issue.7, p.1216, 1981. ,
DOI : 10.1109/JQE.1981.1071267
GaN laser self-mixing velocimeter for measuring slow flows, Optics Letters, vol.35, issue.6, p.814, 2010. ,
DOI : 10.1364/OL.35.000814
Simultaneous laser-diode emission and detection for fiber-optic sensor applications, Optics Letters, vol.20, issue.20, p.2105, 1995. ,
DOI : 10.1364/OL.20.002105