Scattering by anisotropic rough layered 2D interfaces

Saddek Afifi (1) , Richard Dusséaux (2)

1 LAPLASO - Laboratoire de Physique des Lasers, de Spectroscopie Optique et d’Opto-électronique
2 ESTER - LATMOS

We propose a statistical study of the scattering of an incident plane wave by a stack of two two-dimensional rough interfaces. The interfaces are characterized by Gaussian height distributions with zero mean values and Gaussian correlation functions. The electromagnetic fields are represented by Rayleigh expansions, and a perturbation method is used for solving the boundary value problem and determining the firstorder scattering amplitudes. For slightly rough interfaces with a finite extension, we show that the modulus of the co- and crosspolarized scattering amplitudes follows a Hoyt law and that the phase is not uniformly distributed. For interfaces with an infinite extension, the modulus follows a Rayleigh law and the phase is uniformly distributed. We show that these results are true for correlated or uncorrelated interfaces and for isotropic or anisotropic interfaces.

Domaines: Electromagnétisme

Saddek Afifi, Richard Dusséaux. Scattering by anisotropic rough layered 2D interfaces. IEEE Transactions on Antennas and Propagation, 2012, 60 (11), pp.5315 - 5328. ⟨10.1109/TAP.2012.2207671⟩. ⟨hal-00730659⟩