Radio Frequency Characterization of LTCC Materials in K and W Bands

Khodor Hussein Rida (1, 2) , Camilla Kärnfelt (3, 2) , Alain Peden (1, 2) , Jean-Philippe Coupez (3, 2) , Guy Chuiton (3, 2) , Pascal Coant (1, 2)

1 Lab-STICC_TB_MOM_PIM
2 MO - Département Micro-Ondes
3 Lab-STICC_TB_MOM_DIM

Telecommunication and automotive industry requires high volume and low cost circuit fabrication, while at the same time demanding excellent electrical performance, reliability, circuit miniaturization and surface mounting techniques. Today, the multilayer LTCC (Low Temperature Co-fired Ceramics) technology is getting more attention for millimetre wave applications, and is often chosen because of its high degree of integration and its high-reliability properties.This technology is being installed in our laboratory at Telecom Bretagne and the commercial ESL41110 tape was selected to make our first RF LTCC circuits. This tape was characterized at ESL (Electro Science Laboratory) from 3 to 19 GHz, and the substrate properties such as dielectric constant and insertion loss are given in [1].

Domaines: Electronique

Khodor Hussein Rida, Camilla Kärnfelt, Alain Peden, Jean-Philippe Coupez, Guy Chuiton, et al.. Radio Frequency Characterization of LTCC Materials in K and W Bands. Giga-Hertz symposium, Mar 2012, Stockholm, Sweden. ⟨hal-00724986⟩