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Modulation of quartz-like GeO2 structure by Si substitution: an X-ray diffraction study of Ge1-xSixO2 (0

Abstract : The spontaneous nucleation by the high temperature flux method of GeO2 and SiO2-substituted GeO2 (Ge1-xSixO2) compounds was improved to give single-crystals free of hydroxyl groups. The crystal structure and quality of these α-quartz-like piezoelectric materials was studied by single-crystal X-Ray Diffraction (XRD) at room temperature. The refinements gave excellent final reliability factors which are an indication of single-crystals with a low level of defects. A good correlation was found between the silicon content in Ge1-xSixO2 crystals determined through extrapolation from the inter-tetrahedral bridging angle and that found from Energy Dispersive X-ray spectroscopy (EDX). The effect of the germanium substitution by silicon on the distortion of the α-quartz-type GeO2 structure was followed by the evolution of both the intra-tetrahedral angle and the other structural parameters. The TO4 (T= Si, Ge) distortion was found to be larger in α-GeO2 than in α-SiO2 and, as expected, the irregularity of the TO4 tetrahedra decreased linearly as the substitution of Ge by Si increased.
Mots-clés : quartz single crystal XRD
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Contributor : Pascale Armand Connect in order to contact the contributor
Submitted on : Thursday, June 28, 2012 - 2:40:38 PM
Last modification on : Wednesday, March 23, 2022 - 3:17:09 AM
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Adrien Lignie, Dominique Granier, Pascale Armand, Julien Haines, Philippe Papet. Modulation of quartz-like GeO2 structure by Si substitution: an X-ray diffraction study of Ge1-xSixO2 (0. Journal of Applied Crystallography, International Union of Crystallography, 2012, 45, pp.272-278. ⟨10.1107/S0021889812003081⟩. ⟨hal-00712810⟩



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