Second-Order coherence properties of parametric emission in Semiconductor 1D Microcavities
Résumé
Semiconductor microcavities with embedded quantum wells have revealed a rich variety of phenomena based on polariton or exciton interactions [1,2]. Among these effects, parametric scattering and related effects [2,3] are very interesting and promising candidates for the realization of micro-metric and integrable sources for quantum information applications. Optical parametric oscillation (OPO) in microcavity-based systems has been successfully demonstrated in multiple cavities as well as in one-dimensional cavities [2,4]. In these systems the excitation can be done under normal incidence, eventually relaxing the strong coupling constraint [4]. Moreover, exploiting an energy-degenerate configuration, Signal end Idler beams are perfectly balanced in intensity. Here, we address the second-order coherence properties of parametric emission in one dimensional microcavities. We measured the g(2) function at zero time-delay using a HBT interferometer, gathering information about the photon statistics of the emission. Our data shows that across the parametric oscillation threshold a change in the statistics of the emission occurs, going from a thermal-like source towards a partially coherent source. These results allows highlighting substantial differences between a polariton-based micro-OPO and the behavior expected for a standard OPO. [1] P.G. Savvidis et al. Phys. Rev. Lett. 84, 1547 (2000) [2] E. Wertz et al., Nat. Phys. 6, 860 (2010) [3] C. Diederichs et al. Nature 440, 904 (2006) [4] M. Abbarchi et al. Phys. Rev. B, 83, 20130(R) (2011)