Terahertz and far-infrared response of BaxSr1-xTiO3 films

Abstract : Here, we report on the experimental study of terahertz (THz) and far-infrared dielectric response of polycrystalline BaxSr1-xTiO3 (x = 0.5, 0.7, and 0.8) films of 0.3-1 mu m thicknesses deposited on a sapphire. THz and far-infrared transmission measurements were performed in 100-420 K temperature range covering the vicinity of TC of their bulk prototypes. We identified all polar optical phonons observed in bulk samples below 400 cm-1 of the same composition including soft and central modes and found some additional features, which we assigned to the depolarizing field effect coming from the structural inhomogeneity and unreleased strain.
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Communication dans un congrès
Czech-Polish Seminar 2010 on Structural and Ferroelectric Phase Transitions, May 2010, Telč, Czech Republic. 83 (10-11), pp.966-973, 2011, 〈10.1080/01411594.2010.509608〉
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https://hal.archives-ouvertes.fr/hal-00672151
Contributeur : Bernadette Bergeret <>
Soumis le : lundi 20 février 2012 - 16:10:35
Dernière modification le : jeudi 11 janvier 2018 - 06:23:22

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P. Kuzel, E. Simon, T. Ostapchuk, J. Hlinka, S. Kamba, et al.. Terahertz and far-infrared response of BaxSr1-xTiO3 films. Czech-Polish Seminar 2010 on Structural and Ferroelectric Phase Transitions, May 2010, Telč, Czech Republic. 83 (10-11), pp.966-973, 2011, 〈10.1080/01411594.2010.509608〉. 〈hal-00672151〉

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