Skip to Main content Skip to Navigation
Journal articles

Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses

Complete list of metadatas

https://hal.archives-ouvertes.fr/hal-00670550
Contributor : Nathalie Labat <>
Submitted on : Wednesday, February 15, 2012 - 4:10:15 PM
Last modification on : Thursday, January 11, 2018 - 6:27:11 AM

Identifiers

  • HAL Id : hal-00670550, version 1

Citation

G. A. Koné, B. Grandchamp, C. Hainaut, F. Marc, C. Maneux, et al.. Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. Microelectronics Reliability, Elsevier, 2011, 51 (9-11), pp.1730-1735. ⟨hal-00670550⟩

Share

Metrics

Record views

152