Proceedings of 20th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2009 (Special issue of Microelectronics Reliability, Vol. 49, Issues 9-11)

Nathalie Labat 1 D. Lewis 2
2 IMS
IMS - Laboratoire de l'intégration, du matériau au système
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Submitted on : Wednesday, February 15, 2012 - 2:40:10 PM
Last modification on : Thursday, January 11, 2018 - 6:27:11 AM

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Nathalie Labat, D. Lewis. Proceedings of 20th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2009 (Special issue of Microelectronics Reliability, Vol. 49, Issues 9-11). Elsevier, pp.470, 2009. ⟨hal-00670468⟩

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