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Article Dans Une Revue Microelectronics Reliability Année : 2009

Net integrity checking by optical localization techniques

Résumé

To determine the failing net out of a list of potential candidates provided by the ATPG diagnostic tool, probing techniques such as TRE or LVP are commonly used. To use these techniques, complex electrical setups using tester have to be implemented to control the failing net to its failing value. This paper present an alternative technique to check net integrity and to orient failure location based on optical techniques. Experimental results and simulation presented in this study demonstrate the relevance and the efficiency of this technique.
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Dates et versions

hal-00669741 , version 1 (13-02-2012)

Identifiants

  • HAL Id : hal-00669741 , version 1

Citer

Gerald Haller, A. Machouat, D. Lewis, V. Pouget. Net integrity checking by optical localization techniques. Microelectronics Reliability, 2009, 49, pp.1175-1181. ⟨hal-00669741⟩
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