A new single-error correction scheme correction scheme based on self-diagnosis residu number arithmetic

Yangyang Tang (1) , Emmanuel Boutillon (1) , Christophe Jego (2) , Michel Jezequel (3)

1 Lab-STICC_UBS_CACS_IAS
2 IMS - Laboratoire de l'intégration, du matériau au système
3 Lab-STICC_TB_CACS_IAS

Domaines: Electronique

Yangyang Tang, Emmanuel Boutillon, Christophe Jego, Michel Jezequel. A new single-error correction scheme correction scheme based on self-diagnosis residu number arithmetic. Conference on Design and Architectures for Signal and Image Processing (DASIP'2010), Oct 2010, Edinburgh, France. pp.1-5. ⟨hal-00663387⟩