Imagery of local defects in multilayer components by short coherence length interferometry - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Optics Letters Année : 2002

Imagery of local defects in multilayer components by short coherence length interferometry

Résumé

We propose to image local defects inside multidielectric optical components by using a special configuration Linnik interference microscope, along with a CCD camera and a dedicated detection, to extract the amplitude scattered by the defects in the interference image. The use of a short coherence length source allows one to obtain interference only from a thin slice (similar to1 mum) within the observed object. The object is tilted to permit the use of a dark-field configuration to enhance the defect contrast. We describe the experimental setup and the detection scheme. Images that exhibit local point defects on the interfaces of various multilayer optical components (laser mirrors) are presented.
Fichier principal
Vignette du fichier
OptLetters_27_21_2002.pdf (244.51 Ko) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-00661342 , version 1 (19-01-2012)

Identifiants

Citer

Laurent Vabre, Vincent Loriette, Arnaud Dubois, Julien Moreau, A.C. Boccara. Imagery of local defects in multilayer components by short coherence length interferometry. Optics Letters, 2002, 27 (21), pp.1899-1901. ⟨10.1364/OL.27.001899⟩. ⟨hal-00661342⟩
150 Consultations
143 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More