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Integration of high resolution spatial and spectral data acquisition systems to provide complementary datasets for cultural heritage applications

Abstract : Modern optical measuring systems are able to record objects with high spatial and spectral precision. The acquisition of spatial data is possible with resolutions of a few hundredths of a millimeter using active projection-based camera systems, while spectral data can be obtained using filter-based multispectral camera systems that can capture surface spectral reflectance with high spatial resolution. We present a methodology for combining data from these two discrete optical measuring systems by registering their individual measurements into a common geometrical frame. Furthermore, the potential for its application as a tool for the non-invasive monitoring of paintings and polychromy is evaluated. The integration of time-referenced spatial and spectral datasets is beneficial to record and monitor cultural heritage. This enables the type and extent of surface and colorimetric change to be precisely characterized and quantified over time. Together, these could facilitate the study of deterioration mechanisms or the efficacy of conservation treatments by measuring the rate, type, and amount of change over time. An interdisciplinary team of imaging scientists and art scholars was assembled to undertake a trial program of repeated data acquisitions of several valuable historic surfaces of cultural heritage objects. The preliminary results are presented and discussed.
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https://hal.archives-ouvertes.fr/hal-00638588
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Submitted on : Sunday, November 6, 2011 - 2:44:11 PM
Last modification on : Friday, August 5, 2022 - 2:54:00 PM
Long-term archiving on: : Tuesday, February 7, 2012 - 2:20:55 AM

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  • HAL Id : hal-00638588, version 1

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Camille Chane Simon, Uwe Huxhagen, Alamin Mansouri, Adrian Heritage, Frank Boochs, et al.. Integration of high resolution spatial and spectral data acquisition systems to provide complementary datasets for cultural heritage applications. IS&T/SPIE Electronic Imaging meeting, Jan 2010, San Jose, United States. pp.75310L-1, 75310L-9. ⟨hal-00638588⟩

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