A simple fault-tolerant digital voter circuit in TMR nanoarchitectures

Tian Ban (1)

1 Télécom ParisTech

Nanoelectronic systems are now more and more prone to faults and defects, permanent or transient. Redundancy techniques are implemented widely to increase the reliability, especially the TMR - Triple Modular Redundancy. However, many researchers assume that the voter is perfect and this may not be true. This paper proposes a simple but effective fault-tolerant voter circuit which is more reliable and less expensive. Experimental results demonstrate its improvement over the former TMR structures

Domaines: Performance et fiabilité [cs.PF]

Tian Ban. A simple fault-tolerant digital voter circuit in TMR nanoarchitectures. 2010 8th IEEE International NEWCAS Conference (NEWCAS), Jun 2010, Montreal, Canada. pp.269 - 272, ⟨10.1109/NEWCAS.2010.5603933⟩. ⟨hal-00637639⟩