Mechanical properties of nanocrystalline materials, Progress in Materials Science, vol.51, issue.4, p.427, 2006. ,
DOI : 10.1016/j.pmatsci.2005.08.003
Atomic-scale simulations of the mechanical deformation of nanocrystalline metals, Physical Review B, vol.60, issue.17, p.11971, 1999. ,
DOI : 10.1103/PhysRevB.60.11971
Surface tension effect on the mechanical properties of nanomaterials measured by atomic force microscopy, Physical Review B, vol.69, issue.16, p.165410, 2004. ,
DOI : 10.1103/PhysRevB.69.165410
A comparison of the strength of multilayers, thin films and nanocrystalline compacts, Scripta Materialia, vol.50, issue.6, p.729, 2004. ,
DOI : 10.1016/j.scriptamat.2003.11.038
Structural and residual stress analysis by non destructive methods: Evaluation, application, assessment. Amsterdam, 1997. ,
Residual stresses. Measurements by diffraction and interpretation, 1987. ,
Machine for Uniaxial Tensile Straining in the X???Ray Diffractometer, Review of Scientific Instruments, vol.37, issue.1, p.77, 1966. ,
DOI : 10.1063/1.1719956
An X???Ray Method for Accurate Determination of Lattice Strains of Crystals, Review of Scientific Instruments, vol.39, issue.11, p.1647, 1968. ,
DOI : 10.1063/1.1683194
Mapping two-dimensional state of strain using synchroton X-ray diffraction, Scripta Materialia, vol.39, issue.12, p.1705, 1998. ,
DOI : 10.1016/S1359-6462(98)00385-6
Synchrotron X-ray study of bulk lattice strains in externally loaded Cu-Mo composites, Metallurgical and Materials Transactions A, vol.85, issue.11, p.2949, 2000. ,
DOI : 10.1007/BF02830344
Experimental measurement of lattice strain pole figures using synchrotron x rays, Review of Scientific Instruments, vol.76, issue.11, p.113903, 2005. ,
DOI : 10.1063/1.2130668
Tensile testing of ultrathin polycrystalline films: A synchrotron-based technique, Review of Scientific Instruments, vol.75, issue.4, p.1110, 2004. ,
DOI : 10.1063/1.1669124
A new bulge test technique for the determination of Young's modulus and Poisson's ratio of thin films, Journal of Materials Research, vol.9, issue.12, p.3242, 1992. ,
DOI : 10.1063/1.1708831
High-temperature bulge-test setup for mechanical testing of free-standing thin films, Review of Scientific Instruments, vol.74, issue.3, p.1383, 2003. ,
DOI : 10.1063/1.1539901
Development and validation of an experimental setup for the biaxial fatigue testing of metal thin films, Review of Scientific Instruments, vol.77, issue.10, p.103902, 2006. ,
DOI : 10.1063/1.2357313
Influence of tantalum and silver interlayers on thermal stress evolution in copper thin films on silicon substrates, Scripta Materialia, vol.50, issue.6, p.733, 2004. ,
DOI : 10.1016/j.scriptamat.2003.11.039
Master of Science Thesis, 2009. ,
Materials data sheet No H-38492-2 for Kapton ® ,
Optimal design of biaxial tensile cruciform specimens, Journal of the Mechanics and Physics of Solids, vol.41, issue.1, p.143, 1993. ,
DOI : 10.1016/0022-5096(93)90067-P
Specimen for a novel concept of the biaxial tension test, Journal of Materials Processing Technology, vol.167, issue.2-3, p.177, 2005. ,
DOI : 10.1016/j.jmatprotec.2005.05.028
On the diffractive determination of single-crystal elastic constants using polycrystalline samples, Journal of Applied Crystallography, vol.34, issue.5, p.585, 2001. ,
DOI : 10.1107/S0021889801010482
Invited Article: Simultaneous mapping of temperature and stress in microdevices using micro-Raman spectroscopy, Review of Scientific Instruments, vol.78, issue.6, p.61301, 2007. ,
DOI : 10.1063/1.2738946
Mesoscale x-ray diffraction measurement of stress relaxation associated with buckling in compressed thin films, Applied Physics Letters, vol.83, issue.1, p.51, 2003. ,
DOI : 10.1063/1.1591081