Combined synchrotron X-rays and image correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton

Abstract : Abstract In-situ biaxial tensile tests within the elastic domain were conducted with W/Cu nanocomposite thin films deposited on a polyimide cruciform substrate thanks to a biaxial testing machine developed on the DiffAbs beamline at SOLEIL synchrotron. The mechanical behavior of the nanocomposite was characterized at the micro-scale and the macro-scale using simultaneously synchrotron X-ray diffraction and digital image correlation techniques. Strain analyses for equi-biaxial and non equi-biaxial loading paths have been performed. The results show that the two strain measurements match to within 1 × 10-4 in the elastic domain for strain levels less than 0.3% and for both loading paths.
Complete list of metadatas

Cited literature [45 references]  Display  Hide  Download

https://hal.archives-ouvertes.fr/hal-00624445
Contributor : François Hild <>
Submitted on : Saturday, September 17, 2011 - 2:51:26 PM
Last modification on : Wednesday, May 29, 2019 - 1:51:10 AM
Long-term archiving on : Sunday, December 18, 2011 - 2:20:56 AM

File

JAC2011-ccsd.pdf
Files produced by the author(s)

Identifiers

  • HAL Id : hal-00624445, version 1

Citation

Soundes Djaziri, Pierre-Olivier Renault, François Hild, Eric Le Bourhis, Philippe Goudeau, et al.. Combined synchrotron X-rays and image correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton. Journal of Applied Crystallography, International Union of Crystallography, 2011, 44, pp.1071-1079. ⟨hal-00624445⟩

Share

Metrics

Record views

358

Files downloads

340