Electrical Measurement of the Thermal Impedance of Bipolar Transistors

Abdelkader El Rafei (1) , Raymond Quéré (1) , Raphaël Sommet (1)

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In this letter, we present a characterization method for the determination of the thermal impedance of heterostructure bipolar transistors. The thermal impedance was characterized using low-frequency S-parameter measurements. We will show that our method can be used to characterize the thermal impedance independent of the transistor size.

Abdelkader El Rafei, Raymond Quéré, Raphaël Sommet. Electrical Measurement of the Thermal Impedance of Bipolar Transistors. IEEE Electron Device Letters, 2010, 31 (9), pp.939-941. ⟨10.1109/LED.2010.2052232⟩. ⟨hal-00606398⟩