Characterization of KTa0.5Nb0.5O3 ferroelectric thin films at microwaves and their application to highly-tunable resonators

Yonathan Corredores (1) , Quentin Simon (1, 2) , Arnaud Le Febvrier (2) , Lingyan Zhang (3) , Xavier Castel (1) , Ratiba Benzerga (1) , Ronan Sauleau (1) , Stéphanie Députier (2) , Noham Martin (3) , Gérard Tanné (4) , Maryline Guilloux-Viry (2) , Kouroch Mahdjoubi (1)

1 IETR - Institut d'Electronique et de Télécommunications de Rennes
2 ISCR - Institut des Sciences Chimiques de Rennes
3 Lab-STICC - Laboratoire des sciences et techniques de l'information, de la communication et de la connaissance (UMR 3192)
4 Lab-STICC_UBO_MOM_DIM

Domaines: Matériaux; Micro et nanotechnologies/Microélectronique

Yonathan Corredores, Quentin Simon, Arnaud Le Febvrier, Lingyan Zhang, Xavier Castel, et al.. Characterization of KTa0.5Nb0.5O3 ferroelectric thin films at microwaves and their application to highly-tunable resonators. E-MRS 2011 Spring Meeting "European Material Research Society", May 2011, Nice, France. ⟨hal-00596648⟩