Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation

Type de document :
Communication dans un congrès
20th European Symposium Reliabilty on Electron Devices, Failure Physics and Analysis (ESREF) 2010, Oct 2010, Monteccassino, Italy. pp.1, 2010
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https://hal.archives-ouvertes.fr/hal-00585666
Contributeur : Chrystel Plumejeau <>
Soumis le : mercredi 13 avril 2011 - 16:50:13
Dernière modification le : jeudi 11 janvier 2018 - 06:21:09

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  • HAL Id : hal-00585666, version 1

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F. Infante, Philippe Perdu, Dean Lewis. Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation. 20th European Symposium Reliabilty on Electron Devices, Failure Physics and Analysis (ESREF) 2010, Oct 2010, Monteccassino, Italy. pp.1, 2010. 〈hal-00585666〉

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