Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation

Abstract : The More than Moore axis of development in microelectronic technologies is generating increasingly complex assembly techniques. It has therefore become very hard to localize a current leakage inside such structures. One very important problem which has not yet been faced is the case of a current leakage on a ground plane, both at system and PCB level. This kind of problem cannot be solved with the techniques currently in use. Based on the recent developments of the magnetic microscopy techniques which involve the use of magnetic simulations to localize current leakages, we have developed a new methodology which allows us to localize currents flowing inside ground planes. To do that, we also developed a new way of generating magnetic simulations, which significantly increases the performance of localization in terms of analysis time and resolution.
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Article dans une revue
Microelectronics Reliability, Elsevier, 2010, pp.1700-1705. 〈10.1016/j.microrel.2010.07.109〉
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https://hal.archives-ouvertes.fr/hal-00585644
Contributeur : Chrystel Plumejeau <>
Soumis le : mercredi 13 avril 2011 - 16:12:40
Dernière modification le : vendredi 23 novembre 2012 - 14:45:11

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F. Infante, Philippe Perdu, Dean Lewis. Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation. Microelectronics Reliability, Elsevier, 2010, pp.1700-1705. 〈10.1016/j.microrel.2010.07.109〉. 〈hal-00585644〉

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