Optimized design of control plans based on risk exposure and resources capabilities

Belgacem Bettayeb (1) , Samuel Bassetto (1) , Michel Tollenaere (1)

1 G-SCOP_SIREP - Système d’Information, conception RobustE des Produits

In this paper, we present a coherent method for Quality Control planning that tackles the limitations of traditional approaches when applied to an advanced high-mix medium volume 300mm fab. The proposed approach consists of two stages and takes into account both the risk exposure, expressed in terms of quantity of products potentially lost, and resources capabilities (process and measurement tools).

Mots clés: Risks; control plan; risk exposure optimization

Domaines: Automatique / Robotique

Belgacem Bettayeb, Samuel Bassetto, Michel Tollenaere. Optimized design of control plans based on risk exposure and resources capabilities. International Symposium on Semiconductor Manufacturing, Oct 2010, Tokyo, Japan. pp.267-270. ⟨hal-00579882⟩