Filter Based-BIST for SINAD measurement of A/D Converter

Chiheb Rebai (1) , Dominique Dallet (2) , Philippe Marchegay (2)

1 SUP'COM
2 IMS - Laboratoire de l'intégration, du matériau au système

Built in Self Test (BIST) for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means to perform in the field diagnostics. This paper discusses a spectral based BIST for SINAD measurement (Signal to Noise And Distortion Ratio) of A/D Converters. Digital filter structure will be used to decompose the signal from the ADC into its main spectral components. The BIST scheme is based on a time- recursive implementation of an arbitrary transform. The proposed structure is based on the use of IIR biquadratic notch filters for tracking the desired spectral component. The power of the sine wave and the notch can be determined using a combination of digital filters, squaring functions and integrators.

Domaines: Micro et nanotechnologies/Microélectronique

Chiheb Rebai, Dominique Dallet, Philippe Marchegay. Filter Based-BIST for SINAD measurement of A/D Converter. DCIS 2001, Nov 2001, Porto, Portugal. pp.162-166. ⟨hal-00567943⟩