Measurement Accuracy of Filter Bank Based ADC Built In Self Test

Chiheb Rebai (1) , Dominique Dallet (2) , Philippe Marchegay (2)

1 SUP'COM
2 IMS - Laboratoire de l'intégration, du matériau au système

In this paper, we present the analysis of Built-In-Self-Test (BIST) scheme for Analogue to Digital Converter (ADC). This work focuses on a filter bank based BIST for power spectral density measurement. Digital filter structure will be used to decompose the ADC output signal into its main spectral components. Numerical simulations are conducted to validate our idea and the results show that the scheme is a promising BIST approach for ADC.

Domaines: Micro et nanotechnologies/Microélectronique

Chiheb Rebai, Dominique Dallet, Philippe Marchegay. Measurement Accuracy of Filter Bank Based ADC Built In Self Test. IMEKO TC-4 2002, Sep 2002, Zagreb, Croatia. pp.146-151. ⟨hal-00567907⟩