Continuous-wave scanning terahertz near-field microscope

Abstract : A versatile cw measurement setup for terahertz near-field reflectometry is proposed. Propagation, coupling, and focusing of wire guided modes are used to achieve a λ/33 resolution while imaging a metal corner deposited on glass. The setup is source and detector independent owing to wave coupling and decoupling with differential phase plates.
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Submitted on : Thursday, February 10, 2011 - 5:13:00 PM
Last modification on : Tuesday, May 28, 2019 - 5:10:11 PM

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Jean-Paul Guillet, L. Chusseau, R. Adam, T. Grosjean, A. Pénarier, et al.. Continuous-wave scanning terahertz near-field microscope. Microwave and Optical Technology Letters, Wiley, 2011, 53 (3), pp.580-582. ⟨10.1002/mop.25754⟩. ⟨hal-00565014⟩



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