Faceted sidewalls of silicon nanowires : Au-induced structural reconstructions and electronic properties

T. Xu , J.P. Nys , A. Addad , O.I. Lebedev , A. Urbieta , B. Salhi , Maxime Berthe , B. Grandidier , D. Stievenard (1)

1 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520

T. Xu, J.P. Nys, A. Addad, O.I. Lebedev, A. Urbieta, et al.. Faceted sidewalls of silicon nanowires : Au-induced structural reconstructions and electronic properties. Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2010, 81, pp.115403-1-10. ⟨10.1103/PhysRevB.81.115403⟩. ⟨hal-00549070⟩