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Article Dans Une Revue Materials Science and Engineering: B Année : 1997

Comparative study of hexagonal and cubic GaN growth by RF-MBE

G. Feuillet
  • Fonction : Auteur
F. Widmann
  • Fonction : Auteur
B. Daudin
  • Fonction : Auteur
J. Schuler
  • Fonction : Auteur
M. Arlery
  • Fonction : Auteur
Jl Rouviere
N. Pelekanos
  • Fonction : Auteur
Olivier Briot

Résumé

The epitaxial growth of both cubic and hexagonal GaN epilayers is considered here with the aim of comparing their physical properties. In particular, the growth mechanisms at the first stages of growth will be dealt with together with the quality of the growth front. The optical characteristics of the epilayers will be compared by reference to the structure of the defects present within the different types of layers. (C) 1997 Elsevier Science S.A.
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Dates et versions

hal-00546192 , version 1 (13-12-2010)

Identifiants

  • HAL Id : hal-00546192 , version 1

Citer

G. Feuillet, F. Widmann, B. Daudin, J. Schuler, M. Arlery, et al.. Comparative study of hexagonal and cubic GaN growth by RF-MBE. Materials Science and Engineering: B, 1997, 50, pp.233-237. ⟨hal-00546192⟩
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