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Charging and emission effects of multiwalled carbon nanotubes probed by electric force microscopy

M. Zdrojek Thierry Melin 1 C. Boyaval 1, 2 D. Stievenard 3 Benoit Jouault 4 M. Wozniak A. Huczko W. Gebicki L. Adamowicz
2 CMNF-IEMN - Centrale de Micro Nano Fabrication - IEMN
IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520
3 PHYSIQUE-IEMN - Physique-IEMN
IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520
Abstract : Electrostatic properties of single-separated multiwalled carbon nanotubes (MWCNTs) deposited on a dielectric layer have been investigated by charge injection and electric force microscopy (EFM) experiments. We found that upon local injection from the biased EFM tip, charges delocalize over the whole nanotube length (i.e., 1-10 μ m), consistent with a capacitive charging of the MWCNT-substrate capacitance. In addition, the insulating layer supporting the nanotubes is shown to act as a charge-sensitive plate for electrons emitted from the MWCNTs at low electric fields, thus allowing the spatial mapping of MWCNT field-emission patterns. © 2005 American Institute of Physics.
Keywords : FIELD-EMISSION FILMS
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Submitted on : Tuesday, November 30, 2010 - 10:07:39 PM
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M. Zdrojek, Thierry Melin, C. Boyaval, D. Stievenard, Benoit Jouault, et al.. Charging and emission effects of multiwalled carbon nanotubes probed by electric force microscopy. Applied Physics Letters, American Institute of Physics, 2005, 86, pp.213114. ⟨10.1063/1.1925782⟩. ⟨hal-00541611⟩

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