The grain microstructure of polycrystalline materials as revealed by the combined use of synchrotron X-ray imaging and diffraction techniques
Résumé
Combining the principles of x-ray imaging and diffraction techniques, it has recently become possible to map the 3D grain microstructure in a range of polycrystalline materials. Associating this 3D orientation mapping with conventional attenuation and/or phase contrast tomography yields a non-destructive characterization technique, enabling time-lapse observation of dynamic processes in the bulk of structural materials. The capabilities and limitations., as well as future perspectives of this new characterization approach will be discussed and illustrated on selected application examples.
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