GRAIN MAPPING BY DIFFRACTION CONTRAST TOMOGRAPHY: EXTENDING THE TECHNIQUE TO SUB-GRAIN INFORMATION

A. King (1, 2) , P. Reischig (1) , Simon Martin (2) , Joao F. B. D. Fonseca (2) , M. Preuss (2) , Wolfgang Ludwig (3)

1 ESRF - European Synchrotron Radiation Facility
2 University of Manchester [Manchester]
3 MATEIS - Matériaux, ingénierie et science [Villeurbanne]

During the last few years diffraction contrast tomography has become established as a technique for mapping polycrystalline microstructures in 3D. The experiment combines aspects of synchrotron microtomography and of 3D-XRD. The diffraction spots arising from individual grains are recorded with high spatial and angular resolution, and reveal evidence of sub-grain structures. However, the interpretation and exploitation of this information is not simple. The present manuscript will describe diffraction contrast tomography, and show examples of the data collected. Two concepts for the interpretation of the data will be described. Some preliminary results of a study of the in-situ deformation of polycrystalline aluminium will be shown. However, the aim of this paper is to show examples of the data available, and to enable an open discussion of possible techniques for its analysis. Perspectives will be given for future grain tracking experiments at the newly commissioned high energy materials science beamline at Petra III, Hamburg. 1

Domaines: Science des matériaux [cond-mat.mtrl-sci]

A. King, P. Reischig, Simon Martin, Joao F. B. D. Fonseca, M. Preuss, et al.. GRAIN MAPPING BY DIFFRACTION CONTRAST TOMOGRAPHY: EXTENDING THE TECHNIQUE TO SUB-GRAIN INFORMATION. Risø International Symposium on Materials Science: Challenges in materials science and possibilities in 3D and 4D characterization techniques, Sep 2010, Denmark. ⟨hal-00531696⟩