Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction

E.F. Rauch (1) , J. Portillo (2) , S. Nicolopoulos (2) , D. Bultreys (2) , S. Rouvimov (3) , P. Moeck (4)

1 SIMaP - Science et Ingénierie des Matériaux et Procédés
2 NanoMEGAS, Brussels
3 SERVEIS Cientificotecn
4 Dept. Phys., Nanocrystallog. Grp

An automated technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope is described. It is primarily based on the projected reciprocal lattice geometry that is extracted from electron diffraction spot patterns. Precession electron diffraction patterns are especially useful for this purpose. The required hardware allows for a scanning-precession movement of the primary electron beam on the crystalline sample and can be interfaced to any older or newer mid-voltage transmission electron microscope (TEM). Experimentally obtained crystal phase and orientation maps are shown for a variety of samples. Comprehensive commercial and open-access crystallographic databases may be used in support of the nanocrystal phase identification process and are briefly mentioned.

Mots clés: Nanocrystals; Orientation mapping; Structural mapping; Structural; fingerprinting; Structural databases; Precession electron diffraction; Transmission electron microscopy; BACKSCATTER DIFFRACTION; IMAGING MICROSCOPY; PATTERNS; TEM; IDENTIFICATION; CRYSTALLOGRAPHY; INTENSITIES

Domaines: Matériaux

E.F. Rauch, J. Portillo, S. Nicolopoulos, D. Bultreys, S. Rouvimov, et al.. Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction. Zeitschrift für Kristallographie, 2010, 225 (2-3), pp.103-109. ⟨10.1524/zkri.2010.1205⟩. ⟨hal-00528054⟩