X-ray diffraction use for nanostructural investigation of wood cellulose deformation

Cédric Montero (1) , Bruno Clair (1) , Tancrède Almeras (1) , Arie van Der Lee (2)

1 MAB - Mécanique de l'Arbre et du Bois
2 IEM - Institut Européen des membranes

An overview is given how X-ray diffraction can be used for the investigation of the deformation of wood cellulose at the nanoscale.

Domaines: Cristallographie; Science des matériaux [cond-mat.mtrl-sci]

Cédric Montero, Bruno Clair, Tancrède Almeras, Arie van Der Lee. X-ray diffraction use for nanostructural investigation of wood cellulose deformation. Experimental and Computational Micro-Characterization techniques in Wood Mechanics, Oct 2010, Hamburg, Germany. ⟨hal-00525585⟩