MODELING OF BUNDLE WITH RADIATED LOSSES FOR BCI TESTING

Fabrice Duval (1) , Bélhacène Mazari (1) , Olivier Maurice (2, 3) , F. Fouquet , Anne Louis (1) , T. Le Guyader

1 IRSEEM - Institut de Recherche en Systèmes Electroniques Embarqués
2 GERAC
3 VALEO

In order to simulate the BCI (Bulk Cable Injection) tests we try to derive an equivalent model of the wires leading to the DUT (Device Under Test). This model will be used to perform test simulations according to automotive specifications [2]. The standard does not specify the relative position of the wires. But, in lot of cases, their positions are preponderant. The simulation is a very good way to estimate their influence.

Mots clés: EMC; IC; emission; immunity; susceptibility; modelling; IEC; integrated circuit; electromagnetic compatibility

Domaines: Micro et nanotechnologies/Microélectronique

Fabrice Duval, Bélhacène Mazari, Olivier Maurice, F. Fouquet, Anne Louis, et al.. MODELING OF BUNDLE WITH RADIATED LOSSES FOR BCI TESTING. 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2002, Toulouse, France. pp. 27-30. ⟨hal-00517762⟩