Impact of PLL 1/f^2 and White Phase Noise in RF Bandpass Sampling Processing

Luis Lolis (1) , Michael Pelissier (1) , Carolynn Bernier (1) , Dominique Dallet (2) , Jean-Baptiste Begueret (2)

1 CEA-LETI - Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information
2 IMS - Laboratoire de l'intégration, du matériau au système

This work presents a new method to numerically calculate the signal to jitter distortion ratio (SDjR) for any modulated input which is bandpass sampled in the presence of jitter. The numerical method matches the derived analytical equations. It is shown that the impact of white phase noise depends on the signal center frequency and the sub sampling factor while the impact of correlated jitter depends mostly on the signal center frequency. By separating the impact of both phase noise types on the SDjR, specifications for PLL phase noise are derived for a given sampling frequency.

Domaines: Micro et nanotechnologies/Microélectronique

Luis Lolis, Michael Pelissier, Carolynn Bernier, Dominique Dallet, Jean-Baptiste Begueret. Impact of PLL 1/f^2 and White Phase Noise in RF Bandpass Sampling Processing. 8th International NEWCAS Conference, NEWCAS 2010, Jun 2010, Montréal, Canada. pp.325-328. ⟨hal-00501607⟩