Effects of Power consumption and Temperature on Lifetime Reliability of ArchC based Processor Architecture

Tushar Gupta (1, 2) , Clément Bertolini (1, 2) , Olivier Héron (2) , Nicolas Ventroux (2) , Thomas Zimmer (1) , François Marc (1)

1 IMS - Laboratoire de l'intégration, du matériau au système
2 DACLE-LIST - Département d'Architectures, Conception et Logiciels Embarqués-LIST

Domaines: Micro et nanotechnologies/Microélectronique

Tushar Gupta, Clément Bertolini, Olivier Héron, Nicolas Ventroux, Thomas Zimmer, et al.. Effects of Power consumption and Temperature on Lifetime Reliability of ArchC based Processor Architecture. Workshop on Design for Reliability and Variability, Nov 2009, Austin, United States. ⟨hal-00499484⟩