Characterization of structural, optical and electric properties of TiO2 thin films prepared by reactive DC magnetron sputtering. - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2007

Characterization of structural, optical and electric properties of TiO2 thin films prepared by reactive DC magnetron sputtering.

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hal-00479016 , version 1 (30-04-2010)

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  • HAL Id : hal-00479016 , version 1

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S. Boukrouh, R. Mechiakh, R. Bensaha, S. Bourgeois, M.C. Marco de Lucas. Characterization of structural, optical and electric properties of TiO2 thin films prepared by reactive DC magnetron sputtering.. 24th European Crystallographic Meeting (ECM24), Aug 2007, Marrakech, Morocco. pp.s256. ⟨hal-00479016⟩
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