Atom probe study of sodium distribution in polycrystalline Cu(In,Ga)Se-2 thin film

Emmanuel Cadel (1) , Nicolas Barreau (2) , John Kessler (2) , Philippe Pareige (3, 4)

1 GPM - Groupe de physique des matériaux
2 IMN - Institut des Matériaux Jean Rouxel
3 FANO - Fédération Acoustique du Nord-Ouest
4 LOMC - Laboratoire Ondes et Milieux Complexes

This article reports the first investigations of CuIn1-xGaxSe2 (CIGSe) polycrystalline thin films by means of atom probe tomography. Attention is focused on the distribution of Na atoms within the films. Both Na-containing and Na-free CIGSe thin films have been investigated. When Na is available during the CIGSe coevaporation, it is observed to be mainly segregated at the grain boundaries of the films; however, it is also detected within the grains of CIGSe at very low concentration.

Domaines: Science des matériaux [cond-mat.mtrl-sci]

Emmanuel Cadel, Nicolas Barreau, John Kessler, Philippe Pareige. Atom probe study of sodium distribution in polycrystalline Cu(In,Ga)Se-2 thin film. Acta Materialia, 2010, 58 (7), pp.2634. ⟨10.1016/j.actamat.2009.12.049⟩. ⟨hal-00477285⟩