On the application of x-ray microtomography in the field of materials science

Eric Maire (1) , Jean-Yves Buffiere (1) , L. Salvo , J.J. Blandin , Wolfgang Ludwig (2) , J.M. Letang (3)

1 MATEIS - Matériaux, ingénierie et science [Villeurbanne]
2 ESRF - European Synchrotron Radiation Facility [Grenoble]
3 INSA Lyon - Institut National des Sciences Appliquées de Lyon

The principle of the tomography technique and the different possible set-ups, which can be used to obtain medium-(10 μm) and high-(1 μm) resolution, three-dimensional, non-destructive images, are shown in this paper. Illustrations are made of the applications of the technique in the field of materials science. Examples are given for medium-resolution images of metallic foams and model metal matrix composites that are reinforced with spherical particles. High-resolution examples are shown for aluminium alloys. For low-absorbent materials we show that the phase contrast obtained using synchrotron radiation can provide a valuable solution. The quantitative use of these images, coupled with in-situ tensile tests or used for the simple analysis of the initial microstructure of several structural materials, is also described.

Domaines: Matériaux

Eric Maire, Jean-Yves Buffiere, L. Salvo, J.J. Blandin, Wolfgang Ludwig, et al.. On the application of x-ray microtomography in the field of materials science. Advanced Engineering Materials, 2001, pp.539-546. ⟨10.1002/1527-2648(200108)3:8<539::AID-ADEM539>3.0.CO;2-6⟩. ⟨hal-00475297⟩