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Communication Dans Un Congrès Année : 2005

Etching Mechanisms of Low-k Materials with the Solid FirstTM ILD Process in Fluorocarbon Based Plasma

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hal-00461617 , version 1 (05-03-2010)

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  • HAL Id : hal-00461617 , version 1

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T. Chevolleau, D. Eon, Maxime Darnon, L. Vallier, O. Joubert. Etching Mechanisms of Low-k Materials with the Solid FirstTM ILD Process in Fluorocarbon Based Plasma. AVS 52nd international symposium, 2005, United States. ⟨hal-00461617⟩
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