Study of the chamber ceramic erosion of the SPT X000-ML by Optical Emission Spectroscopy and Redeposition on Silicon Substrates inside the Channel for Tooled Ceramics at Various Virtual Lifetimes

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https://hal.archives-ouvertes.fr/hal-00458823
Contributor : Stéphane Pellerin <>
Submitted on : Monday, February 22, 2010 - 1:55:19 PM
Last modification on : Tuesday, March 19, 2019 - 6:28:01 PM

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Daniel Pagnon, Stéphane Pellerin, Pascal Lasgorceix, Claude Legentils. Study of the chamber ceramic erosion of the SPT X000-ML by Optical Emission Spectroscopy and Redeposition on Silicon Substrates inside the Channel for Tooled Ceramics at Various Virtual Lifetimes. 30th International Electric Propulsion Conference (IEPC 2007), Sep 2007, Florence, Italy. ⟨hal-00458823⟩

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