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Measuring and Improving Design Patterns Testability

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https://hal.archives-ouvertes.fr/hal-00448043
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Submitted on : Monday, January 18, 2010 - 11:37:53 AM
Last modification on : Wednesday, April 27, 2022 - 3:49:38 AM

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  • HAL Id : hal-00448043, version 1

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Benoît Baudry, Yves Le Traon, Gerson Sunyé, Jean-Marc Jézéquel. Measuring and Improving Design Patterns Testability. 9th IEEE International Software Metrics Symposium (METRICS 2003), 2003, Australia. pp.50-61. ⟨hal-00448043⟩

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