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Article Dans Une Revue IEEE Transactions on Magnetics Année : 2009

Investigation of metallic/oxide interfaces in Pt/Co/AlOx trilayers by hard x-ray reflectivity

Résumé

X-ray reflectivity (XRR) is used to determine the oxidation front at the nanometer scale in sputtered perpendicular semi tunnel junctions, as the form Pt/Co/AlOx, by varying the oxidation time tOx of the capping layer. From XRR simulations, we show that the nature of the stack is gradually defined according to the value of tOx. For low tOx values (<40 s), a simple Pt/Co/Al/AlOx multilayer is appearing whereas a Pt/Co/CoO/AlOx architecture takes place for higher tOx. The oxygen-induced magnetic properties obtained by extraordinary Hall effects measurements are explained by the structural results. The increase of Co-O bondings with tOx is at the origin of the appearing of the perpendicular magnetic anisotropy (PMA).
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Dates et versions

hal-00443714 , version 1 (04-01-2010)

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Citer

Farid Fettar, Houmed Garad, Luc Ortega, Aline Y. Ramos, Bartosz Zawilski, et al.. Investigation of metallic/oxide interfaces in Pt/Co/AlOx trilayers by hard x-ray reflectivity. IEEE Transactions on Magnetics, 2009, 45 (10), pp.3905-3908. ⟨10.1109/TMAG.2009.2021670⟩. ⟨hal-00443714⟩
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