Fast and accurate measurement of the RMS value of a noncoherent sampled sine-wafe

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https://hal.archives-ouvertes.fr/hal-00417635
Contributor : Dominique Dallet <>
Submitted on : Wednesday, September 16, 2009 - 2:30:51 PM
Last modification on : Thursday, January 11, 2018 - 6:21:06 AM

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  • HAL Id : hal-00417635, version 1

Citation

Daniel Belega, Dominique Dallet. Fast and accurate measurement of the RMS value of a noncoherent sampled sine-wafe. IMEKO XIX World Congress : Fundamental and Applied Technology, Sep 2009, Lisbonne, Portugal. pp.792-796. ⟨hal-00417635⟩

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