Accurate ADC dynamic testing by means of the three-parameter sine-fit algorithm

Complete list of metadatas

https://hal.archives-ouvertes.fr/hal-00412251
Contributor : Dominique Dallet <>
Submitted on : Tuesday, September 1, 2009 - 11:45:07 AM
Last modification on : Thursday, January 11, 2018 - 6:21:06 AM

Identifiers

Citation

Daniel Belega, Dominique Dallet. Accurate ADC dynamic testing by means of the three-parameter sine-fit algorithm. International Mixed-Signals, Sensors, and Systems Test Workshop - IMS3TW '09, Jun 2009, scottsdale, United States. pp.1-6, ⟨10.1109/IMS3TW.2009.5158682⟩. ⟨hal-00412251⟩

Share

Metrics

Record views

164