G. Edwards, K. Stiller, G. Dunlop, and M. Couper, The precipitation sequence in Al???Mg???Si alloys, Acta Materialia, vol.46, issue.11, p.3893, 1998.
DOI : 10.1016/S1359-6454(98)00059-7

C. Marioara, S. Andersen, J. Jansen, and H. Zandbergen, The influence of temperature and storage time at RT on nucleation of the ????? phase in a 6082 Al???Mg???Si alloy, Acta Materialia, vol.51, issue.3, p.789, 2003.
DOI : 10.1016/S1359-6454(02)00470-6

M. Murayama, K. Hono, M. Saga, and M. Kikuchi, Atom probe studies on the early stages of precipitation in Al???Mg???Si alloys, Materials Science and Engineering: A, vol.250, issue.1, p.127, 1998.
DOI : 10.1016/S0921-5093(98)00548-6

M. Murayama and K. Hono, Pre-precipitate clusters and precipitation processes in Al???Mg???Si alloys, Acta Materialia, vol.47, issue.5, p.1537, 1999.
DOI : 10.1016/S1359-6454(99)00033-6

D. Vaumousse, A. Cerezo, and P. Warren, A procedure for quantification of precipitate microstructures from three-dimensional atom probe data, Ultramicroscopy, vol.95, p.215, 2003.
DOI : 10.1016/S0304-3991(02)00319-4

D. Blavette, A. Bostel, J. Sarrau, B. Deconihout, and A. Menand, An atom probe for three-dimensional tomography, Nature, vol.363, issue.6428, p.432, 1993.
DOI : 10.1038/363432a0

T. Kelly, P. Camus, D. Larson, L. Holzman, and S. Bajikar, On the many advantages of local-electrode atom probes, Ultramicroscopy, vol.62, issue.1-2, p.29, 1996.
DOI : 10.1016/0304-3991(95)00086-0

E. Bemont, A. Bostel, M. Bouet, G. Da-costa, S. Chambreland et al., Effects of incidence angles of ions on the mass resolution of an energy compensated 3D atom probe, Ultramicroscopy, vol.95, p.231, 2003.
DOI : 10.1016/S0304-3991(02)00321-2

E. A. Marquis, Microstructural evolution and strengthtening mechanisms in Al-Sc and Al-Mg-Sc alloys, 2002.

C. K. Sudbrack, Decomposition Behavior in Model Ni-Al-Cr-X Superalloys: Temporal Evolution and Compositional Pathways on a Nanoscale, 2004.

C. Marioara, S. Andersen, J. Jansen, and H. Zandbergen, Atomic model for GP-zones in a 6082 Al???Mg???Si system, Acta Materialia, vol.49, issue.2, p.321, 2001.
DOI : 10.1016/S1359-6454(00)00302-5

D. Blavette, F. Vurpillot, P. Pareige, and A. Menand, A model accounting for spatial overlaps in 3D atom-probe microscopy, Ultramicroscopy, vol.89, issue.1-3, p.145, 2001.
DOI : 10.1016/S0304-3991(01)00120-6