Single Event Transients (SETs) in RF Circuits

N. Varanasi , W. M. Chen , H. J. Barnaby , B. Vermeire , J. Cressler , Herve Lapuyade (1) , Vincent Pouget (1) , Pascal Fouillat (1)

1 IMS - Laboratoire de l'intégration, du matériau au système

Domaines: Electronique

N. Varanasi, W. M. Chen, H. J. Barnaby, B. Vermeire, J. Cressler, et al.. Single Event Transients (SETs) in RF Circuits. 15th Single-Event Effects Symposium, 2006, Long Beach, United States. ⟨hal-00398023⟩