Using the SEEM software for SET testing and analysis

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https://hal.archives-ouvertes.fr/hal-00397867
Contributor : Frédéric Darracq <>
Submitted on : Tuesday, June 23, 2009 - 2:47:58 PM
Last modification on : Thursday, October 4, 2018 - 11:14:07 AM

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  • HAL Id : hal-00397867, version 1

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Vincent Pouget, Pascal Fouillat, Dean Lewis. Using the SEEM software for SET testing and analysis. Radiation Effects on Embedded Systems, Springer, pp.259-268, 2007. ⟨hal-00397867⟩

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